Casa xps relative sensitivity factor reference

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The analyses of thin film samples are chosen for model cases as this is from where the bulk of XPS reports presently emanate and also where the author's key expertise lies. The topic selection and the discussion level are intended to be accessible for novices yet challenging possible preconceptions of experienced practitioners. Six application examples highlight the broad range of research questions that can be answered by XPS. To counter that, we offer a comprehensive tutorial written in the form of a step-by-step guide starting from experimental planning, through sample selection and handling, instrument setup, data acquisition, spectra analysis, and results presentation. While there are many factors responsible for this situation, the lack of insight of physical principles combined with seeming ease of XPS operation and insufficient training are certainly the major ones. Should this trend continue, it would have disastrous consequences for scientific research. There is a growing concern within the surface science community that the massive increase in the number of XPS articles over the last few decades is accompanied by a decrease in work quality including in many cases meaningless chemical bond assignment.

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